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Products & Services

LCS 4000 Analytical Probe Station with Laser Cutting

The LCS-4000 Series Analytical Probe station with Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking, and topside layer removal. All of these functions can be performed on a microscopic level on this one system, which provides a high level of performance that is remarkably easy to use.


Seeking Equipment for R&D and Semiconductor Production

Call 0845 340 2626 or contact us online for more information Should you require information to assist you in your Equipment Purchasing or Field Service Support, please call the number above and our friendly staff will be pleased to help.
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